Papers › Vision-Language In-Context Learning Driven Few-Shot Visual Inspection Model
Vision-Language In-Context Learning Driven Few-Shot Visual Inspection Model
Shiryu Ueno, Yoshikazu Hayashi, Shunsuke Nakatsuka, Yusei Yamada, Hiroaki Aizawa, Kunihito Kato
We propose general visual inspection model using Vision-Language Model~(VLM) with few-shot images of non-defective or defective products, along with explanatory texts that serve as inspection criteria. Although existing VLM exhibit high performance across various tasks, they are not trained on specific tasks such as visual inspection. Thus, we construct a dataset consisting of diverse images of non-defective and defective products collected from the web, along with unified formatted output text, and fine-tune VLM. For new products, our method employs In-Context Learning, which allows the model to perform inspections with an example of non-defective or defective image and the corresponding explanatory texts with visual prompts. This approach eliminates the need to collect a large number of training samples and re-train the model for each product. The experimental results show that our method achieves high performance, with MCC of 0.804 and F1-score of 0.950 on MVTec AD in a one-shot manner. Our code is available at~https://github.com/ia-gu/Vision-Language-In-Context-Learning-Driven-Few-Shot-Visual-Inspection-Model.
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