Papers › Thermal and IR Drop Analysis Using Convolutional Encoder-Decoder Networks
Thermal and IR Drop Analysis Using Convolutional Encoder-Decoder Networks
Vidya A. Chhabria, Vipul Ahuja, Ashwath Prabhu, Nikhil Patil, Palkesh Jain, Sachin S. Sapatnekar
Computationally expensive temperature and power grid analyses are required during the design cycle to guide IC design. This paper employs encoder-decoder based generative (EDGe) networks to map these analyses to fast and accurate image-to-image and sequence-to-sequence translation tasks. The network takes a power map as input and outputs the corresponding temperature or IR drop map. We propose two networks: (i) ThermEDGe: a static and dynamic full-chip temperature estimator and (ii) IREDGe: a full-chip static IR drop predictor based on input power, power grid distribution, and power pad distribution patterns. The models are design-independent and must be trained just once for a particular technology and packaging solution. ThermEDGe and IREDGe are demonstrated to rapidly predict the on-chip temperature and IR drop contours in milliseconds (in contrast with commercial tools that require several hours or more) and provide an average error of 0.6% and 0.008% respectively.
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