Papers › SCL-VI: Self-supervised Context Learning for Visual Inspection of Industrial Defects
SCL-VI: Self-supervised Context Learning for Visual Inspection of Industrial Defects
Peng Wang, Haiming Yao, Wenyong Yu
The unsupervised visual inspection of defects in industrial products poses a significant challenge due to substantial variations in product surfaces. Current unsupervised models struggle to strike a balance between detecting texture and object defects, lacking the capacity to discern latent representations and intricate features. In this paper, we present a novel self-supervised learning algorithm designed to derive an optimal encoder by tackling the renowned jigsaw puzzle. Our approach involves dividing the target image into nine patches, tasking the encoder with predicting the relative position relationships between any two patches to extract rich semantics. Subsequently, we introduce an affinity-augmentation method to accentuate differences between normal and abnormal latent representations. Leveraging the classic support vector data description algorithm yields final detection results. Experimental outcomes demonstrate that our proposed method achieves outstanding detection and segmentation performance on the widely used MVTec AD dataset, with rates of 95.8% and 96.8%, respectively, establishing a state-of-the-art benchmark for both texture and object defects. Comprehensive experimentation underscores the effectiveness of our approach in diverse industrial applications.
Code
Repository list and official/mentioned flags are the archive's, frozen 2025-07-28. Reachability, where shown, is from one Syntology probe window (2026-09-16 to 2026-09-18); repositories not probed show nothing. GitHub stars are not tracked.
Code Syntology ran Syntology
Not run by Syntology. Nothing on this page verifies that the listed code works.
Tasks
Results from the paper archive 2025-07-28
| Task | Dataset | Model | Metric | Value | Rank at snapshot | Leaderboard | Report |
|---|---|---|---|---|---|---|---|
| Anomaly Detection | MVTec AD | SCL-VI | Detection AUROC | 95.81 | #86 of 148 | Archive leaderboard | report |
| Anomaly Detection | MVTec AD | SCL-VI | Segmentation AUROC | 96.76 | #86 of 148 | Archive leaderboard | report |
Ranks are positions in the archive's leaderboards as they stood at the 2025-07-28 snapshot. Results published since then are not among these rows, so a rank here is not a current standing.
Methods
Report a problem or propose a change · a person checks every report against the paper or source before anything changes; decisions are listed on /corrections