Papers › Learning and Controlling Silicon Dopant Transitions in Graphene using Scanning...
Learning and Controlling Silicon Dopant Transitions in Graphene using Scanning Transmission Electron Microscopy
Max Schwarzer, Jesse Farebrother, Joshua Greaves, Ekin Dogus Cubuk, Rishabh Agarwal, Aaron Courville, Marc G. Bellemare, Sergei Kalinin, Igor Mordatch, Pablo Samuel Castro, Kevin M. Roccapriore
We introduce a machine learning approach to determine the transition dynamics of silicon atoms on a single layer of carbon atoms, when stimulated by the electron beam of a scanning transmission electron microscope (STEM). Our method is data-centric, leveraging data collected on a STEM. The data samples are processed and filtered to produce symbolic representations, which we use to train a neural network to predict transition probabilities. These learned transition dynamics are then leveraged to guide a single silicon atom throughout the lattice to pre-determined target destinations. We present empirical analyses that demonstrate the efficacy and generality of our approach.
Code
Repository list and official/mentioned flags are the archive's, frozen 2025-07-28. Reachability, where shown, is from one Syntology probe window (2026-09-16 to 2026-09-18); repositories not probed show nothing. GitHub stars are not tracked.
Code Syntology ran Syntology
Not run by Syntology. Nothing on this page verifies that the listed code works.
Results from the paper archive 2025-07-28
No leaderboard rows for this paper in the archive.
Report a problem or propose a change · a person checks every report against the paper or source before anything changes; decisions are listed on /corrections