Papers › Electrostatic Discovery Atomic Force Microscopy
Electrostatic Discovery Atomic Force Microscopy
Niko Oinonen, Chen Xu, Benjamin Alldritt, Filippo Federici Canova, Fedor Urtev, Shuning Cai, Ondřej Krejčí, Juho Kannala, Peter Liljeroth, Adam S. Foster
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While offering unprecedented resolution of atomic and electronic structure, Scanning Probe Microscopy techniques have found greater challenges in providing reliable electrostatic characterization at the same scale. In this work, we introduce Electrostatic Discovery Atomic Force Microscopy, a machine learning based method which provides immediate quantitative maps of the electrostatic potential directly from Atomic Force Microscopy images with functionalized tips. We apply this to characterize the electrostatic properties of a variety of molecular systems and compare directly to reference simulations, demonstrating good agreement. This approach opens the door to reliable atomic scale electrostatic maps on any system with minimal computational overhead.
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