Papers › Characterization of XIA UltraLo-1800 Response to Measuring Charged Samples
Characterization of XIA UltraLo-1800 Response to Measuring Charged Samples
Joshua Ange, Robert Calkins, Andrew Posada
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Commercial alpha counters are used in science and industry applications to screen materials for surface radon progeny contamination. In this paper, we characterize an XIA UltraLo-1800, an ionization drift alpha counter, and study the response to embedded charge in polyethylene sample measurements. We show that modeling such effects is possible in a Geant4-based simulation framework and attempt to derive corrections. This paper also demonstrates the effectiveness of the use of an anti-static fan to eliminate the embedded charge and recover a 97.73% alpha detection efficiency in the alpha counter.
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