Papers › Measurement of the CKM Matrix Element |V_(cb)| from B⁰ →D^(*-) ℓ^+ ν_ℓ at Belle
Measurement of the CKM Matrix Element |V_(cb)| from B⁰ →D^(*-) ℓ^+ ν_ℓ at Belle
E. Waheed, P. Urquijo, I. Adachi, K. Adamczyk, H. Aihara, S. Al Said, D. M. Asner, H. Atmacan, T. Aushev, R. Ayad, V. Babu, I. Badhrees, V. Bansal, P. Behera, C. Beleno, F. Bernlochner, B. Bhuyan, T. Bilka, J. Biswal, A. Bobrov, G. Bonvicini, A. Bozek, M. Bracko, T. E. Browder, M. Campajola, D. Cervenkov, P. Chang, V. Chekelian, A. Chen, B. G. Cheon, K. Chilikin, H. E. Cho, K. Cho, S. -K. Choi, Y. Choi, S. Choudhury, D. Cinabro, S. Cunliffe, S. Di Carlo, Z. Dolezal, T. V. Dong, D. Dossett, S. Eidelman, D. Epifanov, J. E. Fast, B. G. Fulsom, R. Garg, V. Gaur, A. Garmash, A. Giri, P. Goldenzweig, B. Golob, O. Grzymkowska, J. Haba, T. Hara, K. Hayasaka, H. Hayashii, M. T. Hedges, W. -S. Hou, C. -L. Hsu, T. Iijima, K. Inami, G. Inguglia, A. Ishikawa, M. Iwasaki, Y. Iwasaki, W. W. Jacobs, H. B. Jeon, S. Jia, Y. Jin, D. Joffe, K. K. Joo, J. Kahn, A. B. Kaliyar, G. Karyan, T. Kawasaki, C. H. Kim, D. Y. Kim, K. T. Kim, S. H. Kim, K. Kinoshita, P. Kodys, S. Korpar, D. Kotchetkov, P. Krizan, R. Kroeger, P. Krokovny, T. Kuhr, R. Kulasiri, A. Kuzmin, Y. -J. Kwon, J. S. Lange, J. Y. Lee, S. C. Lee, C. H. Li, L. K. Li, Y. B. Li, L. Li Gioi, J. Libby, K. Lieret, D. Liventsev, P. -C. Lu, T. Luo, J. MacNaughton, M. Masuda, D. Matvienko, M. Merola, F. Metzner, K. Miyabayashi, H. Miyata, R. Mizuk, G. B. Mohanty, T. Mori, R. Mussa, I. Nakamura, M. Nakao, K. J. Nath, Z. Natkaniec, M. Nayak, M. Niiyama, N. K. Nisar, S. Nishida, K. Nishimura, S. Ogawa, H. Ono, P. Pakhlov, G. Pakhlova, B. Pal, S. Pardi, H. Park, S. -H. Park, S. Paul, R. Pestotnik, L. E. Piilonen, V. Popov, E. Prencipe, M. Prim, A. Rostomyan, G. Russo, Y. Sakai, M. Salehi, S. Sandilya, T. Sanuki, V. Savinov, O. Schneider, G. Schnell, J. Schueler, C. Schwanda, Y. Seino, K. Senyo, O. Seon, M. E. Sevior, V. Shebalin, C. P. Shen, J. -G. Shiu, B. Shwartz, F. Simon, A. Sokolov, E. Solovieva, S. Stanic, M. Staric, Z. S. Stottler, J. F. Strube, T. Sumiyoshi, M. Takizawa, K. Tanida, F. Tenchini, K. Trabelsi, M. Uchida, T. Uglov, Y. Unno, S. Uno, Y. Usov, G. Varner, K. E. Varvell, A. Vinokurova, A. Vossen, C. H. Wang, M. -Z. Wang, P. Wang, E. Won, S. B. Yang, H. Ye, Y. Yusa, Z. P. Zhang, V. Zhilich, V. Zhukova
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We present a new measurement of the CKM matrix element |V_(cb)| from B⁰ →D^(*-) ℓ^+ ν_ℓ decays, reconstructed with the full Belle data set of 711 fb⁻¹ integrated luminosity. Two form factor parameterizations, originally conceived by the Caprini-Lellouch-Neubert (CLN) and the Boyd, Grinstein and Lebed (BGL) groups, are used to extract the product ℱ(1)η_(EW)|V_(cb)| and the decay form factors, where ℱ(1) is the normalization factor and η_(EW) is a small electroweak correction. In the CLN parameterization we find ℱ(1)η_(EW)|V_(cb)| = (35.06 ±0.15 ±0.56) ×10⁻³, ρ²=1.106 ±0.031 ±0.007, R₁(1)=1.229 ±0.028 ±0.009, R₂(1)=0.852 ±0.021 ±0.006. For the BGL parameterization we obtain ℱ(1)η_(EW)|V_(cb)|= (34.93 ±0.23 ±0.59)×10⁻³, which is consistent with the World Average when correcting for ℱ(1)η_(EW). The branching fraction of B⁰ →D^(*-) ℓ^+ ν_ℓ is measured to be ℬ(B⁰→D^(*-)ℓ⁺ν_ℓ) = (4.90 ±0.02 ±0.16)%. We also present a new test of lepton flavor universality violation in semileptonic B decays, (B (B⁰ →D^(*-) e^+ ν))/(B (B⁰ →D^(*-) μ^+ ν)) = 1.01 ±0.01 ±0.03. The errors correspond to the statistical and systematic uncertainties respectively. This is the most precise measurement of ℱ(1)η_(EW)|V_(cb)| and form factors to date and the first experimental study of the BGL form factor parameterization in an experimental measurement.
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