{"about":{"site":"https://codewithpapers.app","non_affiliation":"Code with Papers and Syntology are not affiliated with, endorsed by, or sponsored by Papers with Code, Meta, or the pwc-archive mirror.","licence":"CC BY-SA 4.0","licence_url":"https://creativecommons.org/licenses/by-sa/4.0/legalcode","attribution":"https://codewithpapers.app/attribution","modified":"archive material modified by Syntology; see the attribution page"},"url":"/paper/how-far-can-we-go-with-practical-function","title":"How Far Can We Go with Practical Function-Level Program Repair?","arxiv_id":"2404.12833","date":"2024-04-19","proceeding":null,"authors":["Jiahong Xiang","Xiaoyang Xu","Fanchu Kong","Mingyuan Wu","Zizheng Zhang","Haotian Zhang","Yuqun Zhang"],"abstract":"Recently, multiple Automated Program Repair (APR) techniques based on Large Language Models (LLMs) have been proposed to enhance the repair performance. While these techniques mainly focus on the single-line or hunk-level repair, they face significant challenges in real-world application due to the limited repair task scope and costly statement-level fault localization. However, the more practical function-level APR, which broadens the scope of APR task to fix entire buggy functions and requires only cost-efficient function-level fault localization, remains underexplored. In this paper, we conduct the first comprehensive study of LLM-based function-level APR including investigating the effect of the few-shot learning mechanism and the auxiliary repair-relevant information. Specifically, we adopt six widely-studied LLMs and construct a benchmark in both the Defects4J 1.2 and 2.0 datasets. Our study demonstrates that LLMs with zero-shot learning are already powerful function-level APR techniques, while applying the few-shot learning mechanism leads to disparate repair performance. Moreover, we find that directly applying the auxiliary repair-relevant information to LLMs significantly increases function-level repair performance. Inspired by our findings, we propose an LLM-based function-level APR technique, namely SRepair, which adopts a dual-LLM framework to leverage the power of the auxiliary repair-relevant information for advancing the repair performance. The evaluation results demonstrate that SRepair can correctly fix 300 single-function bugs in the Defects4J dataset, largely surpassing all previous APR techniques by at least 85%, without the need for the costly statement-level fault location information. Furthermore, SRepair successfully fixes 32 multi-function bugs in the Defects4J dataset, which is the first time achieved by any APR technique ever to our best knowledge.","url_abs":"https://arxiv.org/abs/2404.12833v2","url_pdf":"https://arxiv.org/pdf/2404.12833v2.pdf","source":{"archive":"pwc-archive (Hugging Face), CC BY-SA 4.0","snapshot":"2025-07-28","licence_url":"https://creativecommons.org/licenses/by-sa/4.0/legalcode","row_kind":"links_only","authors_date_abstract":"arXiv metadata, CC0 1.0 (https://info.arxiv.org/help/license), from the Kaggle arXiv metadata snapshot of 2026-09-12"},"code_links":[{"paper_slug":"how-far-can-we-go-with-practical-function","repo_url":"https://github.com/ghabix/srepair","is_official":1,"mentioned_in_paper":1,"mentioned_in_github":1,"framework":"pytorch","reach":null}],"tasks":[],"methods":[],"datasets_introduced":[],"methods_introduced":[],"results":[],"syntology":{"atlas_url":"https://app.syntology.ai/?focus=2404.12833","mcp":null,"developers":"https://syntology.ai/developers"},"arxiv_metadata":null,"syntology_extracted_results":null}