{"about":{"site":"https://codewithpapers.app","non_affiliation":"Code with Papers and Syntology are not affiliated with, endorsed by, or sponsored by Papers with Code, Meta, or the pwc-archive mirror.","licence":"CC BY-SA 4.0","licence_url":"https://creativecommons.org/licenses/by-sa/4.0/legalcode","attribution":"https://codewithpapers.app/attribution","modified":"archive material modified by Syntology; see the attribution page"},"url":"/paper/fast-and-exact-outlier-detection-in-metric","title":"Fast and Exact Outlier Detection in Metric Spaces: A Proximity Graph-based Approach","arxiv_id":"2110.08959","date":"2021-10-18","proceeding":null,"authors":["Daichi Amagata","Makoto Onizuka","Takahiro Hara"],"abstract":"Distance-based outlier detection is widely adopted in many fields, e.g., data mining and machine learning, because it is unsupervised, can be employed in a generic metric space, and does not have any assumptions of data distributions. Data mining and machine learning applications face a challenge of dealing with large datasets, which requires efficient distance-based outlier detection algorithms. Due to the popularization of computational environments with large memory, it is possible to build a main-memory index and detect outliers based on it, which is a promising solution for fast distance-based outlier detection. Motivated by this observation, we propose a novel approach that exploits a proximity graph. Our approach can employ an arbitrary proximity graph and obtains a significant speed-up against state-of-the-art. However, designing an effective proximity graph raises a challenge, because existing proximity graphs do not consider efficient traversal for distance-based outlier detection. To overcome this challenge, we propose a novel proximity graph, MRPG. Our empirical study using real datasets demonstrates that MRPG detects outliers significantly faster than the state-of-the-art algorithms.","url_abs":"https://arxiv.org/abs/2110.08959v2","url_pdf":"https://arxiv.org/pdf/2110.08959v2.pdf","source":{"archive":"pwc-archive (Hugging Face), CC BY-SA 4.0","snapshot":"2025-07-28","licence_url":"https://creativecommons.org/licenses/by-sa/4.0/legalcode","row_kind":"links_only","authors_date_abstract":"arXiv metadata, CC0 1.0 (https://info.arxiv.org/help/license), from the Kaggle arXiv metadata snapshot of 2026-09-12"},"code_links":[{"paper_slug":"fast-and-exact-outlier-detection-in-metric","repo_url":"https://github.com/amgt-d1/dod","is_official":1,"mentioned_in_paper":1,"mentioned_in_github":0,"framework":"none","reach":null}],"tasks":[],"methods":[],"datasets_introduced":[],"methods_introduced":[],"results":[],"syntology":{"atlas_url":"https://app.syntology.ai/?focus=2110.08959","mcp":null,"developers":"https://syntology.ai/developers"},"arxiv_metadata":null,"syntology_extracted_results":null}