{"about":{"site":"https://codewithpapers.app","non_affiliation":"Code with Papers and Syntology are not affiliated with, endorsed by, or sponsored by Papers with Code, Meta, or the pwc-archive mirror.","licence":"CC BY-SA 4.0","licence_url":"https://creativecommons.org/licenses/by-sa/4.0/legalcode","attribution":"https://codewithpapers.app/attribution","modified":"archive material modified by Syntology; see the attribution page"},"url":"/paper/detectorless-3d-terahertz-imaging-achieving","title":"Detectorless 3D terahertz imaging: achieving subwavelength resolution with reflectance confocal interferometric microscopy","arxiv_id":"2412.18403","date":"2024-12-24","proceeding":null,"authors":["Jorge Silva","Martin Plöschner","Karl Bertling","Mukund Ghantala","Tim Gillespie","Jari Torniainen","Jeremy Herbert","Yah Leng Lim","Thomas Taimre","Xiaoqiong Qi","Bogdan C. Donose","Tao Zhou","Hoi-Shun Lui","Dragan Indjin","Yingjun Han","Lianhe Li","Alexander Valavanis","Edmund H. Linfield","A. Giles Davies","Paul Dean","Aleksandar D. Rakić"],"abstract":"Terahertz imaging holds great potential for non-destructive material inspection, but practical implementation has been limited by resolution constraints. In this study, we present a single-pixel THz imaging system based on a confocal microscope architecture, utilising a quantum cascade laser as both transmitter and phase-sensitive receiver. Our approach integrates laser feedback interferometry detection to achieve a two-fold improvement in lateral resolution and a two-order-of-magnitude enhancement in axial resolution over conventional imaging through precise interferometric phase measurements. This translates to a lateral resolution near $\\lambda/2$ and a depth of focus better than $\\lambda/5$, significantly outperforming traditional confocal systems. The system can produce a 0.5 Mpixel image in under two minutes, surpassing both raster-scanning single-pixel and multipixel focal-plane array-based imagers. Coherent operation enables simultaneous amplitude and phase image acquisition, and a custom visualisation method links amplitude to image saturation and phase to hue, enhancing material characterisation. A 3D tomographic analysis of a silicon chip reveals subwavelength features, demonstrating the system's potential for high-resolution THz imaging and material analysis. This work sets a new benchmark for THz imaging, overcoming key challenges and opening up transformative possibilities for non-destructive material inspection and characterisation.","url_abs":"https://arxiv.org/abs/2412.18403v4","url_pdf":"https://arxiv.org/pdf/2412.18403v4.pdf","source":{"archive":"pwc-archive (Hugging Face), CC BY-SA 4.0","snapshot":"2025-07-28","licence_url":"https://creativecommons.org/licenses/by-sa/4.0/legalcode","row_kind":"links_only","authors_date_abstract":"arXiv metadata, CC0 1.0 (https://info.arxiv.org/help/license), from the Kaggle arXiv metadata snapshot of 2026-09-12"},"code_links":[{"paper_slug":"detectorless-3d-terahertz-imaging-achieving","repo_url":"https://github.com/jrgsilv/beam-propagation","is_official":1,"mentioned_in_paper":1,"mentioned_in_github":0,"framework":"none","reach":null}],"tasks":[],"methods":[],"datasets_introduced":[],"methods_introduced":[],"results":[],"syntology":{"atlas_url":null,"mcp":null,"developers":"https://syntology.ai/developers"},"arxiv_metadata":null,"syntology_extracted_results":null}