{"about":{"site":"https://codewithpapers.app","non_affiliation":"Code with Papers and Syntology are not affiliated with, endorsed by, or sponsored by Papers with Code, Meta, or the pwc-archive mirror.","licence":"CC BY-SA 4.0","licence_url":"https://creativecommons.org/licenses/by-sa/4.0/legalcode","attribution":"https://codewithpapers.app/attribution","modified":"archive material modified by Syntology; see the attribution page"},"url":"/paper/correction-of-electron-back-scattered","title":"Correction of Electron Back-scattered Diffraction datasets using an evolutionary algorithm","arxiv_id":"1903.02982","date":"2019-03-07","proceeding":null,"authors":["Florian Strub","Marie-Agathe Charpagne","Tresa M. Pollock"],"abstract":"In materials science and particularly electron microscopy, Electron\nBack-scatter Diffraction (EBSD) is a common and powerful mapping technique for\ncollecting local crystallographic data at the sub-micron scale. The quality of\nthe reconstruction of the maps is critical to study the spatial distribution of\nphases and crystallographic orientation relationships between phases, a key\ninterest in materials science. However, EBSD data is known to suffer from\ndistortions that arise from several instrument and detector artifacts. In this\npaper, we present an unsupervised method that corrects those distortions, and\nenables or enhances phase differentiation in EBSD data. The method uses a\nsegmented electron image of the phases of interest (laths, precipitates, voids,\ninclusions) gathered using detectors that generate less distorted data, of the\nsame area than the EBSD map, and then searches for the best transformation to\ncorrect the distortions of the initial EBSD data. To do so, the Covariance\nMatrix Adaptation Evolution Strategy (CMA-ES) is implemented to distort the\nEBSD until it matches the reference electron image. Fast and versatile, this\nmethod does not require any human annotation and can be applied to large\ndatasets and wide areas, where the distortions are important. Besides, this\nmethod requires very little assumption concerning the shape of the distortion\nfunction. Some application examples in multiphase materials with feature sizes\ndown to 1 $\\mu$m are presented, including a Titanium alloy and a Nickel-base\nsuperalloy.","url_abs":"http://arxiv.org/abs/1903.02982v1","url_pdf":"http://arxiv.org/pdf/1903.02982v1.pdf","source":{"archive":"pwc-archive (Hugging Face), CC BY-SA 4.0","snapshot":"2025-07-28","licence_url":"https://creativecommons.org/licenses/by-sa/4.0/legalcode","row_kind":"abstracts"},"code_links":[{"paper_slug":"correction-of-electron-back-scattered","repo_url":"https://github.com/MLmicroscopy/distortions","is_official":0,"mentioned_in_paper":0,"mentioned_in_github":1,"framework":"none","reach":null}],"tasks":[],"methods":[],"datasets_introduced":[],"methods_introduced":[],"results":[],"syntology":{"syntology_url":null,"atlas_url":null,"mcp":null,"developers":"https://syntology.ai/developers"},"arxiv_metadata":null,"syntology_extracted_results":null}