{"url":"/dataset/wm-300k-wafer-map-single-mixed","name":"WM-300K+ wafer map [Single & Mixed]","full_name":null,"description_markdown":"reference paper\r\n\r\nYOUNIS, H., RATTROUT, A., & YOUNIS, M. (2024). DEEP NEURAL NETWORKS FOR EFFICIENT CLASSIFICATION OF SINGLE AND MIXED DEFECT PATTERNS IN SILICON WAFER MANUFACTURING. Journal of Theoretical and Applied Information Technology, 102(3).‏\r\n\r\nA cleaned, balanced dataset for wafer maps with 427,539 wafer maps\r\nthe input is a tensor for an RGB wafer image with a dimension of 56 x 56\r\nthe output is an encoded-hot- shot as a tensor of the shape of 1 x 36","description_withheld":null,"homepage":"https://www.kaggle.com/datasets/husseinsalahyounis/wm-400k-wafer-map-single-and-mixed","introduced_date":null,"introduced_date_note":null,"introduced_by":null,"license":null,"modalities":[{"name":"Images","url":"/datasets/modality/images"}],"tasks":[],"languages":[{"name":"English","url":"/datasets/language/english"}],"variants":["WM-300K+ wafer map [Single & Mixed]"],"data_loaders":[],"num_papers_in_archive":0,"source":{"archive":"pwc-archive (Hugging Face), CC BY-SA 4.0","snapshot":"2025-07-28"},"benchmarks":[],"papers_with_a_benchmark_row":[],"syntology_totals":{"read_at":"2026-09-25T09:33:49+00:00","papers_with_samples":0,"samples_harvested":0,"samples_ran":0,"samples_unverified":0,"pointer_only_for_licence":0,"papers_with_no_sample_that_ran":0,"note":"the per-paper counts above, summed; not a rate"},"papers_note":"The archive never published its papers-using-dataset list; these are papers with a leaderboard row on this dataset's benchmarks."}