{"url":"/dataset/mixedwm38","name":"MixedWM38","full_name":null,"description_markdown":"MixedWM38 Dataset(WaferMap) has more than 38000 wafer maps, including 1 normal pattern, 8 single defect patterns, and 29 mixed defect patterns, a total of 38 defect patterns. \r\n\r\nSource: [Deformable Convolutional Networks for Efficient Mixed-Type Wafer Defect Pattern Recognition](https://ieeexplore.ieee.org/document/9184890)","description_withheld":null,"homepage":"https://github.com/Junliangwangdhu/WaferMap","introduced_date":null,"introduced_date_note":null,"introduced_by":null,"license":{"name":"Creative Commons License","url":"https://creativecommons.org/licenses/by-nc/4.0/"},"modalities":[],"tasks":[{"name":"Classification","url":"/task/classification-1","datasets_with_task":"/datasets/task/classification-1"},{"name":"Semantic Segmentation","url":"/task/semantic-segmentation","datasets_with_task":"/datasets/task/semantic-segmentation"}],"languages":[],"variants":["MixedWM38"],"data_loaders":[],"num_papers_in_archive":1,"source":{"archive":"pwc-archive (Hugging Face), CC BY-SA 4.0","snapshot":"2025-07-28"},"benchmarks":[{"leaderboard":"/sota/classification-on-mixedwm38","task":"Classification","dataset_variant":"MixedWM38","rows":1,"metrics":["Accuracy","MCC"],"first_row_in_archive_order":{"model":"WaferSegClassNet","paper":"/paper/wafersegclassnet-a-light-weight-network-for","metrics":{"Accuracy":"0.9820","MCC":"0.9815"},"code_links":[{"title":"ckmvigil/wafersegclassnet","url":"https://github.com/ckmvigil/wafersegclassnet"}]},"note":"rows are the archive's own order at snapshot; nothing here re-ranks them"},{"leaderboard":"/sota/semantic-segmentation-on-mixedwm38","task":"Semantic Segmentation","dataset_variant":"MixedWM38","rows":1,"metrics":["Dice","Mean IoU"],"first_row_in_archive_order":{"model":"WaferSegClassNet","paper":"/paper/wafersegclassnet-a-light-weight-network-for","metrics":{"Dice":"0.9999","Mean IoU":"0.9999"},"code_links":[{"title":"ckmvigil/wafersegclassnet","url":"https://github.com/ckmvigil/wafersegclassnet"}]},"note":"rows are the archive's own order at snapshot; nothing here re-ranks them"}],"papers_with_a_benchmark_row":[{"paper":"/paper/wafersegclassnet-a-light-weight-network-for","title":"WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects","date":"2022-07-03","rows_on_this_dataset":2,"code_links":1,"syntology":null}],"syntology_totals":{"read_at":"2026-09-24T18:15:14+00:00","papers_with_samples":0,"samples_harvested":0,"samples_ran":0,"samples_unverified":0,"pointer_only_for_licence":0,"papers_with_no_sample_that_ran":0,"note":"the per-paper counts above, summed; not a rate"},"papers_note":"The archive never published its papers-using-dataset list; these are papers with a leaderboard row on this dataset's benchmarks."}